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News
EPA Verification
EPA Program Verifies TraceDetect’s Automated Arsenic Analyzer
Award
TraceDetect Wins "New Technology" Award for Automated Arsenic Analyzer
Events
Feb. 20-22, 2008
SCMA – South Central Membrane Association
El Paso, TX
March 3-6, 2008
Pittcon 2008 Conference & Expo, Booth 2312
New Orleans, LA
March 29 – April 1, 2008
South Carolina Environmental Conference 2008 – AWWA, Booth 130
Myrtle Beach, SC
May 20-22, 2008
EPA Science Forum 2008 Innovative Technologies – Key to Environmental and Economic Progress
Washington, DC
June 8-11, 2008
ACE08 – AWWA Annual Conference & Exposition, Booth 741
Atlanta, GA
July 14-17, 2008
AMTA/SEDA 2008 Joint Conference & Exposition – Membrane Week, Booth 307
Naples, FL
Sept. 22-24, 2008
MINExpo International 2008, Booth #4910
Las Vegas, NV
Oct. 19-22, 2008
WEFTEC.08 – Annual Technical Conference & Exhibition, Booth 13039
Chicago, IL
Oct. 20-23, 2008
CA-NV AWWA – Annual Fall Conference 2008
Reno, NV
Nov. 11-12, 2008
Ultra Pure Water Conference – Microelectronics Water
Phoenix, AZ
Nov. 16-20, 2008
WQTC – AWWA Water Quality Technology Conference & Exposition
Cincinnati, OH
Semiconductor Industry Applications
Even trace levels of metal contaminants can cause critical damage to a wafer. Yields go down, production lines go down. Minimize plant downtime and ensure your product integrity & performance with SafeGuard.
Configurable to monitor for lead, copper, and arsenic, SafeGuard alerts you to the exact source of trace metal contaminants. SafeGuard allows you to spot check throughout the entire semiconductor manufacturing process, pinpointing the exact location of the source of potential contaminants.
- Check wafer baths for trace metal contaminants.
- Determine cleanliness of etching baths.
- Monitor rinse water for inorganic contaminants.